Measurement of the electron-phonon coupling factor dependence on film thickness and grain size in Au, Cr, and Al

✍ Scribed by Hostetler, John L. ;Smith, Andrew N. ;Czajkowsky, Daniel M. ;Norris, Pamela M.

• Book ID: 115348124
• Publisher: The Optical Society
• Year: 1999
• Tongue: English
• Weight: 241 KB
• Volume: 38
• Category: Article
• ISSN: 1559-128X
• DOI: 10.1364/AO.38.003614