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Comment on the dependence of Rq and current noise on grain size in thick film resistors (RFR's): M. Wolf, F. Muller and H. Hemschik. Active Passive Electron. Compon.12, 59 (1985)


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
129 KB
Volume
27
Category
Article
ISSN
0026-2714

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