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Measurement of porous silicon thermal conductivity by micro-Raman scattering

✍ Scribed by Périchon, S.; Lysenko, V.; Remaki, B.; Barbier, D.; Champagnon, B.


Book ID
121497312
Publisher
American Institute of Physics
Year
1999
Tongue
English
Weight
185 KB
Volume
86
Category
Article
ISSN
0021-8979

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