✦ LIBER ✦
Thermal conductivity measurement of submicrometer-scale silicon dioxide films by an extended micro-Raman method
✍ Scribed by Shuo Huang; Xiaodong Ruan; Jun Zou; Xin Fu; Huayong Yang
- Publisher
- Springer-Verlag
- Year
- 2009
- Tongue
- English
- Weight
- 322 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0946-7076
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