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Measurement of mechanical and thermal properties of co-sputtered WSi thin film for MEMS applications

✍ Scribed by Bui Thanh Tung; Dzung Viet Dao; Toshiyuki Toriyama; Susumu Sugiyama


Book ID
106185969
Publisher
Springer-Verlag
Year
2010
Tongue
English
Weight
530 KB
Volume
16
Category
Article
ISSN
0946-7076

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