Measurement of electrical parameters using mixed-signal test bus, IEEE Std. 1149.4

✍ Scribed by Slavko Dejanovic; Ulf Persson; Stefan Kuttainen; Lars Westerfur

• Book ID: 104047314
• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 413 KB
• Volume: 37
• Category: Article
• ISSN: 0263-2241
• DOI: 10.1016/j.measurement.2004.12.002

✦ Synopsis

Test Access Port and Boundary-Scan Architecture, IEEE Std. 1149.1, was developed to ease the test of printed circuit board assemblies (PCBAs). The development of packaging technology and the increasing functionality of a circuit have made traditional testing methods, such as in-circuit tests and functional testing through edge connectors much more difficult or even impossible. Mixed-Signal Test Bus, IEEE Std. 1149.4, which is a further development of IEEE Std. 1149.1 has been developed to enable the testing of analog components and analog interconnects on PCBAs. IEEE Std. 1149.4 compliant circuits contain an analog bus and analog switches. Techniques applicable to the measurement of impedances via IEEE Std. 1149.4 compliant circuits are presented. A filter has been tested and the results are promising. It has been shown by both measurement and simulation that switching impedances can be managed in such a manner that the influence of deviations from their nominal value can be estimated.