✦ LIBER ✦
Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard
✍ Scribed by Gladys Omayra Ducoudray-Acevedo; Jaime Ramírez-Angulo
- Book ID
- 110413254
- Publisher
- Springer US
- Year
- 2003
- Tongue
- English
- Weight
- 357 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0923-8174
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