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[IEEE 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2011) - Santa Barbara, CA, USA (2011.05.16-2011.05.18)] 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop - Optimal Linearity Testing of Sigma-Delta Based Incremental ADCs Using Restricted Code Measurements

✍ Scribed by Kook, Sehun; Gomes, Alfred; Jin, Le; Wheelright, David; Chatterjee, Abhijit

Book ID: 120171053
Publisher: IEEE
Year: 2011
Weight: 857 KB
Category: Article
ISBN: 1457711443
DOI: 10.1109/IMS3TW.2011.32

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