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[IEEE 2012 18th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2012) - Taipei, Taiwan (2012.05.14-2012.05.16)] 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop - Testing and Calibration of SAR ADCs by MCT-Based Bit Weight Extraction

✍ Scribed by Huang, Xuan-Lun; Chen, Hung-I; Huang, Jiun-Lang; Chen, Chang-Yu; Kuo-Tsai, Tseng; Huang, Ming-Feng; Chou, Yung-Fa; Kwai, Ding-Ming

Book ID: 121361990
Publisher: IEEE
Year: 2012
Weight: 228 KB
Category: Article
ISBN: 0769547265
DOI: 10.1109/IMS3TW.2012.11

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