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[IEEE 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2011) - Santa Barbara, CA, USA (2011.05.16-2011.05.18)] 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop - On Pre/Post-Bond Testing and Calibrating SAR ADC Array in 3-D CMOS Imager

✍ Scribed by Huang, Xuan-Lun; Kang, Ping-Ying; Huang, Jiun-Lang; Chou, Yung-Fa; Lee, Yung-Pin; Kwai, Ding-Ming

Book ID: 126631072
Publisher: IEEE
Year: 2011
Weight: 287 KB
Category: Article
ISBN: 1457711443
DOI: 10.1109/IMS3TW.2011.11

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