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[IEEE Fourth IEEE International Caracas Conference on Devices, Circuits and Systems - Oranjestad, Aruba, Netherlands (17-19 April 2002)] Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) - VDDQ: a built-in self-test scheme for analog on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standard

✍ Scribed by Acevedo, G.O.D.; Ramirez-Angulo, J.

Book ID: 126600468
Publisher: IEEE
Year: 2002
Weight: 372 KB
Category: Article
ISBN-13: 9780780373808
DOI: 10.1109/ICCDCS.2002.1004083

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