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Measurement of charge collection profiles in irradiated silicon diodes by lateral IBIC technique

✍ Scribed by F. Fizzotti; E. Colombo; A. Lo Giudice; C. Manfredotti; Z. Medunic; M. Jaksic; E. Vittone

Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
566 KB
Volume
260
Category
Article
ISSN
0168-583X

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