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Recovery of charge collection in heavily irradiated silicon diodes with continuous hole injection

✍ Scribed by V. Cindro; I. Mandič; G. Kramberger; M. Mikuž; M. Zavrtanik

Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
185 KB
Volume
518
Category
Article
ISSN
0168-9002

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