Annealing and charging of slow and fast states in metal-tunnel oxide-silicon diodes measured using capacitance-voltage and current-voltage techniques

✍ Scribed by M.O. Andersson; P. Lundgren; O. Engström; K.R. Farmer

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 412 KB
• Volume: 22
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/0167-9317(93)90165-2