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Characterization of large diameter silicon by low-bias charge collection analysis in Si(Li) pin diodes

✍ Scribed by Abraham Fong; Jack T. Walton; Eugene E. Haller; Heinrich A. Sommer; Jens Guldberg


Publisher
Elsevier Science
Year
1982
Weight
712 KB
Volume
199
Category
Article
ISSN
0167-5087

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