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Measurement of Channel Temperature in GaN High-Electron Mobility Transistors

✍ Scribed by Jungwoo Joh; del Alamo, J.A.; Chowdhury, U.; Tso-Min Chou; Hua-Quen Tserng; Jimenez, J.L.


Book ID
114619812
Publisher
IEEE
Year
2009
Tongue
English
Weight
836 KB
Volume
56
Category
Article
ISSN
0018-9383

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