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Measurement and analysis of hot-carrier-stress effect on NMOSFET's using substrate current characterization

✍ Scribed by Nissan-Cohen, Y.; Franz, G.A.; Kwasnick, R.F.

Book ID: 119967904
Publisher: IEEE
Year: 1986
Tongue: English
Weight: 291 KB
Volume: 7
Category: Article
ISSN: 0741-3106
DOI: 10.1109/EDL.1986.26433

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