To investigate processes occurring during thin-film deposition by plasma chemical vapor deposition, a study was made of the radical species in an RF CHdH\* plasma using photoionization mass spectrometry. The method avoids fragmentation of particles as can occur in conventional mass spectrometry by u
โฆ LIBER โฆ
Mass spectrometry detection of radicals in SiH 4 -CH 4 -H 2 glow discharge plasmas
โ Scribed by Kae-Nune, P; Perrin, J; Guillon, J; Jolly, J
- Book ID
- 120481424
- Publisher
- Institute of Physics
- Year
- 1995
- Tongue
- English
- Weight
- 618 KB
- Volume
- 4
- Category
- Article
- ISSN
- 0963-0252
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