## Abstract We are developing metrology for rapid, quantitative assessment of elastic properties with nanoscale spatial resolution. Atomic force acoustic microscopy (AFAM) methods enable measurements of modulus at either a single point or as a map of local property variations. The information obtai
Mapping mechanical properties on the nanoscale using atomic-force acoustic microscopy
✍ Scribed by D. C. Hurley; M. Kopycinska-Müller; A. B. Kos
- Book ID
- 107523102
- Publisher
- The Minerals, Metals & Materials Society
- Year
- 2007
- Tongue
- English
- Weight
- 902 KB
- Volume
- 59
- Category
- Article
- ISSN
- 1047-4838
No coin nor oath required. For personal study only.
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