Exploring the Electronic and Mechanical Properties of Protein Using Conducting Atomic Force Microscopy
β Scribed by Zhao, Jianwei; Davis, Jason J.; Sansom, Mark S. P.; Hung, Andrew
- Book ID
- 111671703
- Publisher
- American Chemical Society
- Year
- 2004
- Tongue
- English
- Weight
- 399 KB
- Volume
- 126
- Category
- Article
- ISSN
- 0002-7863
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The origin of contrast in atomic force microscopy (AFM) lies in the probe's response to forces between itself and the sample. These forces most commonly result from changes in height as the tip is scanned over the surface, but can also originate in properties inherent in the sample. These have been
## Abstract Both __in situ__ and __ex situ__ methods for quantifying area fraction coverage of protein on a surface using atomic force microscopy were developed. The __in situ__ method used a continuous fluid flow system to observe the kinetics of adsorption in real time. The __ex situ__ method req