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Low thermal drift in highly sensitive doped channel Al0.3Ga0.7As/GaAs/In0.2Ga0.8As micro-Hall element

✍ Scribed by Vasyl P. Kunets; Julia Dobbert; Yuriy I. Mazur; Gregory J. Salamo; Uwe Müller; W. T. Masselink; Helmar Kostial; Evi Wiebicke


Publisher
Springer US
Year
2007
Tongue
English
Weight
445 KB
Volume
19
Category
Article
ISSN
0957-4522

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