Monte-Carlo simulation of gate leakage current effect in P-channel GaAs/Al0.7Ga0.3As HIGFET

✍ Scribed by V. Pankratov; V. Ryzhii

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 148 KB
• Volume: 37
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(94)90133-3