✦ LIBER ✦

Low-temperature mobility measurements on CMOS devices

✍ Scribed by Hairapetian, A.; Gitlin, D.; Viswanathan, C.R.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Low temperature characterization of sili

✍ G. Ghibaudo; F. Balestra 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 951 KB

CMOS mobility degradation coefficients a

✍ Campbell, S.A.; Andersen, P. 📂 Article 📅 1988 🏛 The Institution of Electrical Engineers ⚖ 322 KB

A novel low temperature integration of h

✍ S. Gowrisanker; M.A. Quevedo-Lopez; H.N. Alshareef; B.E. Gnade; S. Venugopal; R. 📂 Article 📅 2009 🏛 Elsevier Science 🌐 English ⚖ 868 KB

Operation of bulk CMOS devices at very l

✍ Hanamura, H.; Aoki, M.; Masuhara, T.; Minato, O.; Sakai, Y.; Hayashida, T. 📂 Article 📅 1986 🏛 IEEE 🌐 English ⚖ 870 KB

Symposium on low temperature devices

✍ B. Yates 📂 Article 📅 1968 🏛 Elsevier Science 🌐 English ⚖ 506 KB

Low temperature time of flight mobility

✍ Gkoumas, S.; Lohstroh, A.; Sellin, P.J. 📂 Article 📅 2009 🏛 Elsevier Science 🌐 English ⚖ 553 KB