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CMOS mobility degradation coefficients at low temperatures

✍ Scribed by Campbell, S.A.; Andersen, P.

Book ID: 114454269
Publisher: The Institution of Electrical Engineers
Year: 1988
Weight: 322 KB
Volume: 135
Category: Article
ISSN: 0143-7100
DOI: 10.1049/ip-i-1.1988.0004

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