Electrical and microstructural propertie
β
Rajagopal Reddy, V. ;Choi, Chel-Jong
π
Article
π
2007
π
John Wiley and Sons
π
English
β 473 KB
## Abstract The microstructural and electrical properties of Ti/Re/Au (10 nm/10 nm/50 nm) ohmic contacts to moderately doped nβtype GaN (4.0 Γ 10^18^ cm^β3^) have been investigated by currentβvoltage (__I__ β__V__), Auger electron microscopy (AES) and transmission electron microscopy (TEM). The ele