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Low resistance Al/Ti/n-GaN ohmic contacts with improved surface morphology and thermal stability

✍ Scribed by Kwak, Joon Seop; Mohney, S E; Lin, Je-Yi; Kern, R S

Book ID: 120265986
Publisher: Institute of Physics
Year: 2000
Tongue: English
Weight: 224 KB
Volume: 15
Category: Article
ISSN: 0268-1242
DOI: 10.1088/0268-1242/15/7/316

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