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Low frequency noise characterizations of ZnO nanowire field effect transistors

✍ Scribed by Wang, Wenyong; Xiong, Hao D.; Edelstein, Monica D.; Gundlach, David; Suehle, John S.; Richter, Curt A.; Hong, Woong-Ki; Lee, Takhee

Book ID: 121194301
Publisher: American Institute of Physics
Year: 2007
Tongue: English
Weight: 847 KB
Volume: 101
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.2496007

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