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Low-Frequency Noise Assessment for Deep Submicrometer CMOS Technology Nodes

✍ Scribed by Claeys, C.; Mercha, A.; Simoen, E.

Book ID: 119961523
Publisher: The Electrochemical Society
Year: 2004
Tongue: English
Weight: 467 KB
Volume: 151
Category: Article
ISSN: 0013-4651
DOI: 10.1149/1.1683633

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