[IEEE RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) - St. Malo, France (13-16 Sept. 1993)] RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) - Low-frequency noise and DC characterization of ionization damage in a 1-μm SOI CMOS technology adapted for space applications

✍ Scribed by Simoen, E.; Magnusson, U.; Van den bosch, G.; Smeys, P.; Colinge, J.P.; Claeys, C.

• Book ID: 111863893
• Publisher: IEEE
• Year: 1994
• Weight: 642 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780317932
• DOI: 10.1109/radecs.1993.316574