Statistical Model for the Circuit Bandwidth Dependence of Low-Frequency Noise in Deep-Submicrometer MOSFETs

✍ Scribed by Gilson I. Wirth; Roberto da Silva; Ralf Brederlow

• Book ID: 114618579
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 198 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.888672