Low-damage surface smoothing of laser cr
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H. Tokioka; H. Yamarin; T. Fujino; M. Inoue; T. Seki; J. Matsuo
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Article
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2007
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Elsevier Science
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English
โ 424 KB
Surface smoothing of laser crystallized polycrystalline silicon (poly-Si) films using gas cluster ion beam (GCIB) technology has been studied. It is found that both SF6-GCIB and O2-GCIB decrease the height of hillocks and reduce the surface roughness of the irradiated films. The mean surface roughne