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Low-Area Wrapper Cell Design for Hierarchical SoC Testing

✍ Scribed by Kyuchull Kim; Kewal K. Saluja

Book ID: 106384442
Publisher: Springer US
Year: 2009
Tongue: English
Weight: 298 KB
Volume: 25
Category: Article
ISSN: 0923-8174
DOI: 10.1007/s10836-009-5117-3

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