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Lognormal and Weibull accelerated life test plans under distribution misspecification

✍ Scribed by Pascual, F.G.; Montepiedra, G.

Book ID: 114668315
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 482 KB
Volume: 54
Category: Article
ISSN: 0018-9529
DOI: 10.1109/tr.2004.837316

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