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Constant-Step-Stress Accelerated Life Test of White OLED Under Weibull Distribution Case

โœ Scribed by JianPing Zhang; TingJun Zhou; Wu, H.; Yu Liu; WenLi Wu; JianXing Ren

Book ID
114620858
Publisher
IEEE
Year
2012
Tongue
English
Weight
204 KB
Volume
59
Category
Article
ISSN
0018-9383

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โœ Do Sun Bai; Myung Soo Kim ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 753 KB

This article presents an optimum simple step-stress accelerated life test for the Weibull distribution under Type I censoring. It is assumed that a log-linear relationship exists between the Weibull scale parameter and the (possibly transformed) stress and that a certain cumulative exposure model fo