Accelerated life test plans under intermittent inspection and type-I censoring: The case of weibull failure distribution

✍ Scribed by Sun-Keun Seo; Bong-Jin Yum

• Publisher: John Wiley and Sons
• Year: 1991
• Tongue: English
• Weight: 1009 KB
• Volume: 38
• Category: Article
• ISSN: 0894-069X
• DOI: 10.1002/1520-6750(199102)38:1<1::aid-nav3220380103>3.0.co;2-3