Optimum simple step-stress accelerated l
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Do Sun Bai; Myung Soo Kim
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Article
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1993
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John Wiley and Sons
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English
β 753 KB
This article presents an optimum simple step-stress accelerated life test for the Weibull distribution under Type I censoring. It is assumed that a log-linear relationship exists between the Weibull scale parameter and the (possibly transformed) stress and that a certain cumulative exposure model fo