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Local Surface Potential Measurements of Carbon Nanotube FETs by Kelvin Probe Force Microscopy

✍ Scribed by Miyato, Yuji; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi

Book ID: 121872929
Publisher: Institute of Pure and Applied Physics
Year: 2005
Tongue: English
Weight: 195 KB
Volume: 44
Category: Article
ISSN: 0021-4922
DOI: 10.1143/JJAP.44.1633

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