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Surface potential images of polycrystalline organic semiconductors obtained by Kelvin probe force microscopy

✍ Scribed by Haichao Huang; Haibo Wang; Jidong Zhang; Donghang Yan

Book ID
106021508
Publisher
Springer
Year
2008
Tongue
English
Weight
425 KB
Volume
95
Category
Article
ISSN
1432-0630

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## Abstract Kelvin probe force microscopy (KPFM) is usually applied to map the local surface potential of nanostructured materials at surfaces and interfaces. KPFM is commonly defined as a β€˜surface technique’, even if this assumption is not fully justified. However, a quantification of the surface