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Atomic Force Microscopy and Kelvin Probe Force Microscopy Measurements of Semiconductor Surface Using Carbon Nanotube Tip Fabricated by Electrophoresis

✍ Scribed by Maeda, Chikashi; Ozeki, Norihito; Kishimoto, Shigeru; Mizutani, Takashi; Sugai, Toshiki; Shinohara, Hisanori

Book ID: 121872925
Publisher: Institute of Pure and Applied Physics
Year: 2002
Tongue: English
Weight: 140 KB
Volume: 41
Category: Article
ISSN: 0021-4922
DOI: 10.1143/JJAP.41.2615

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