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Simultaneous Measurement of Topography and Contact Current by Contact Mode Atomic Force Microscopy with Carbon Nanotube Probe

โœ Scribed by Ishikawa, Makoto; Yoshimura, Masamichi; Ueda, Kazuyuki

Book ID
121872926
Publisher
Institute of Pure and Applied Physics
Year
2002
Tongue
English
Weight
151 KB
Volume
41
Category
Article
ISSN
0021-4922

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The structure, morphology and surface topography of multilayer carbon nanotubes have been studied by transmission electron microscopy (TEM) and atomic force microscopy (AFM). The carbon nanotube three-dimensional structure, and especially that near the cap regions, is resolved by use of these two co