𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Local strain in Si/Si0.6Ge0.4/Si(100) heterostructures by stripe-shape patterning

✍ Scribed by Jangwoong Uhm; Masao Sakuraba; Junichi Murota


Book ID
108290191
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
315 KB
Volume
517
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


In situ investigation by GISAXS and GIXD
✍ M.-I. Richard; T.-U. SchΓΌlli; E. Wintersberger; G. Renaud; G. Bauer πŸ“‚ Article πŸ“… 2006 πŸ› Elsevier Science 🌐 English βš– 272 KB

The growth mode, strain state and shape of Ge islands were analyzed in situ, during their growth on Si(0 0 1), by combining grazing incidence small angle X-ray scattering (GISAXS) and X-ray diffraction (GIXD) measurements. GISAXS measurements provide the detailed evolution of the shape of the grown