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Modeling of the Stark effect in strained Ge0.6Si0.4/Si/Ge0.6Si0.4 resonant tunneling diodes with graded GexSi1−x (0.3<x<0) spacer emitter and collector

✍ Scribed by N. Sfina; S. Abdi-Ben Nasrallah; J.-L. Lazzari; M. Said


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
219 KB
Volume
9
Category
Article
ISSN
1369-8001

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