𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Local electrical characterization of Ag conducting chalcogenide glasses using electric force microscopy

✍ Scribed by A.A. Piarristeguy; M. Ramonda; A. Pradel

Book ID
116672167
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
491 KB
Volume
356
Category
Article
ISSN
0022-3093

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Electrical characterization of locally c
Electrical characterization of locally charged oxidized nanocrystalline diamond films by Kelvin force microscopy
✍ CΛ‡ermΓ‘k, J. ;Kromka, A. ;Rezek, B. πŸ“‚ Article πŸ“… 2008 πŸ› John Wiley and Sons 🌐 English βš– 237 KB

## Abstract A nanocrystalline diamond (NCD) thin film is deposited on a gold electrode and oxygen terminated by r.f. oxygen plasma. An atomic force microscope (AFM) is used to induce electrostatically charged micrometer‐sized areas on the diamond film by applying bias voltages in the range between

Conducting atomic force microscopy studi
Conducting atomic force microscopy studies on local electrical properties of ultrathin SiO2 films
✍ Atsushi Ando; Ryu Hasunuma; Tatsuro Maeda; Kunihiro Sakamoto; Kazushi Miki; Yasu πŸ“‚ Article πŸ“… 2000 πŸ› Elsevier Science 🌐 English βš– 921 KB

## Ε½ . Ε½ . We have demonstrated the characterizations of the local electrical properties of ultrathin 1-4 nm SiO rSi 001 2 Ε½ y5 . structures using a conducting atomic force microscopy with a nanometer-scale resolution in a vacuum 1 = 10 Pa . The measurement in a vacuum enables to reduce the influe