Study of the surface potential and photovoltage of conducting polymers using electric force microscopy
β Scribed by Joseph N. Barisci; Rita Stella; Geoffrey M. Spinks; Gordon G. Wallace
- Book ID
- 117538548
- Publisher
- Elsevier Science
- Year
- 2001
- Tongue
- English
- Weight
- 988 KB
- Volume
- 124
- Category
- Article
- ISSN
- 0379-6779
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π SIMILAR VOLUMES
The local contact potential di β erence (CPD) of di β erent self-assembled n-alkanethiol monolayers on Au substrates has been measured using Kelvin probe force microscopy (KPFM). Our results demonstrate that KPFM can be used to obtain topography and CPD information simultaneously. The measured CPDs sh
## Abstract Atomic force microscopy (AFM) was used to measure the surface forces between a silicon nitride AFM tip and a deposited layer of Athabasca bitumen; the measurements were carried out in pure water (pH 6.0β6.5) and 1 mM KCl solution (pH 9). An AFM pyramidalβshaped tip was moved stepwise us