𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Lithographic importance of base diffusion in chemically amplified photoresists

✍ Scribed by Thomas Schnattinger; Andreas Erdmann


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
295 KB
Volume
86
Category
Article
ISSN
0167-9317

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Acid and base diffusion in chemically am
✍ T. Itani; H. Yoshino; S. Hashimoto; M. Yamana; N. Samoto; K. Kasama πŸ“‚ Article πŸ“… 1997 πŸ› Elsevier Science 🌐 English βš– 274 KB

In order to clarify the photogenerated acid diffusion in resist film, the diffusion behavior of acid, as well as the role of additional base component was investigated in tert-butoxycarbonyl (t-BOC) protected type chemically amplified positive deep ultraviolet (DUV) resists. The resists consisted of

Molecular dynamics simulation of gel for
✍ G.P. Patsis; N. Glezos πŸ“‚ Article πŸ“… 1999 πŸ› Elsevier Science 🌐 English βš– 631 KB

The knowledge of the structural changes that occur during the lithographic process using chemically amplified resists (CARs) is of great importance in process and resist optimization. Molecular dynamics (MD) is a suitable method for the simulation of these microscopic changes. A detailed description

Information-processing capabilities of c
✍ N. G. Rambidi; D. Yakovenchuk πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 350 KB πŸ‘ 3 views

A technique for finding the optimal path in a labyrinth based on wave processes in reaction-diffusion media is elaborated. Three principle points were assumed as a basis for this technique: (i) a hybrid architecture that combines an information-processing reaction-diffusion medium which performs ope