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Light Effect on Negative Bias-Induced Instability of HfInZnO Amorphous Oxide Thin-Film Transistor

✍ Scribed by Dae Woong Kwon; Jang Hyun Kim; Ji Soo Chang; Sang Wan Kim; Wandong Kim; Jae Chul Park; Chang Jung Kim; Byung-Gook Park

Book ID: 114620401
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 821 KB
Volume: 58
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2011.2109388

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