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Leakage currents in SOI MOSFETs

โœ Scribed by Annamalai, N.K.; Biwer, M.C.


Book ID
114554606
Publisher
IEEE
Year
1988
Tongue
English
Weight
538 KB
Volume
35
Category
Article
ISSN
0018-9499

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Diffusion model for high-temperature off
โœ T.E. Rudenko; V.I. Kilchitskaya; A.N. Rudenko ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 281 KB

In this paper off-state drain currents in long-channel inversion mode SOI MOSFETs are investigated in the range 50-320ยฐC by measurements and simulations. The behavior of high-temperature (T>200ยฐC) off-state currents is interpreted in terms of diffusion model, based on the analysis of carrier distrib