Layout-aware scan chain synthesis for improved path delay fault coverage

✍ Scribed by Gupta, P.; Kahng, A.B.; Mandoiu, I.I.; Sharma, P.

• Book ID: 117907393
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 629 KB
• Volume: 24
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2005.850900