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Reducing correlation to improve coverage of delay faults in scan-path design

✍ Scribed by Weiwei Mao; Ciletti, M.D.

Book ID: 119777775
Publisher: IEEE
Year: 1994
Tongue: English
Weight: 710 KB
Volume: 13
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.277638

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