✦ LIBER ✦

Lattice parameter measurements in epitaxic layers

✍ Scribed by Lind, M. D. ;Gertner, E. R. ;Rode, J. P. ;Andrews, A. M.

Book ID: 114498907
Publisher: International Union of Crystallography
Year: 1978
Tongue: English
Weight: 107 KB
Volume: 11
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889878014211

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Measurement of strain and lattice parame

Measurement of strain and lattice parameter in epitaxic layers

✍ Hart, M. ;Lloyd, K. H. 📂 Article 📅 1975 🏛 International Union of Crystallography 🌐 English ⚖ 787 KB

Absolute lattice parameter measurements

Absolute lattice parameter measurements of epitaxial layers

✍ Fewster, P. F. 📂 Article 📅 1982 🏛 International Union of Crystallography 🌐 English ⚖ 317 KB

Discussion of error in lattice-parameter

Discussion of error in lattice-parameter measurements

✍ Weyerer, H. 📂 Article 📅 1960 🏛 International Union of Crystallography 🌐 English ⚖ 360 KB

Precision lattice parameter measurements

Precision lattice parameter measurements of VPE-GaP-epitaxial layers by the „Umweganregung” method

✍ Dr. H.-G. Brühl 📂 Article 📅 1978 🏛 John Wiley and Sons 🌐 English ⚖ 268 KB 👁 1 views

## Precision Lattice Parameter Measurements of WE-Gap-Epitaxial Layers by the Wmweganregung" Method The "Umweganregung" technique according to a method described by SPOONER and WIL-SON was used for the accurate measurement of lattice parameters of (100) slice of VPEgrown layers of gallium phosphid

X-ray triple-crystal diffractometry of d

X-ray triple-crystal diffractometry of defects in epitaxic layers

✍ Holý, V. ;Wolf, K. ;Kastner, M. ;Stanzl, H. ;Gebhardt, W. 📂 Article 📅 1994 🏛 International Union of Crystallography 🌐 English ⚖ 695 KB

Twinning study of CdTe epitaxic layer by

Twinning study of CdTe epitaxic layer by X-ray ι-scan measurement

✍ Brizard, C. ;Rolland, G. ;Laugier, F. 📂 Article 📅 1993 🏛 International Union of Crystallography 🌐 English ⚖ 823 KB